Microelectronics and reliability: an international journal & world abstracting service/
Microelectronics and reliability: an international journal & world abstracting service/
edited by G.W.A. Dummer ... [etal]
- Oxford, New York: Pergamon Press, 1975
- variant pages.: illus.; 27cm.
Volume 14,No.4
1 . Microelectronics.
2 . Electrical and electronic engineering.
621.381/ MIC
Volume 14,No.4
1 . Microelectronics.
2 . Electrical and electronic engineering.
621.381/ MIC