000 00676nam a22002057a 4500
003 DUET_Lib
005 20240314085216.0
008 240314b bg ||||| |||| 00| 0 eng d
020 _a-
040 _cDUET_Lib
082 _221
_a621.381/ MIC
245 _aMicroelectronics and reliability:
_ban international journal & world abstracting service/
_cedited by G.W.A. Dummer ... [etal]
260 _aOxford, New York:
_bPergamon Press,
_c1975
300 _avariant pages.:
_billus.;
_g27cm.
500 _aVolume 14,No.4
650 _a1 . Microelectronics.
_94735
650 _a2 . Electrical and electronic engineering.
_98819
700 _eReiche,H (editor)
942 _2ddc
_cBK
999 _c6834
_d6834